Etching sharp tips from thin metallic wires for tuning-fork-based scanning probe microscopy
نویسندگان
چکیده
منابع مشابه
Scanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
متن کاملTwo-step controllable electrochemical etching of tungsten scanning probe microscopy tips.
Dynamic electrochemical etching technique is optimized to produce tungsten tips with controllable shape and radius of curvature of less than 10 nm. Nascent features such as "dynamic electrochemical etching" and reverse biasing after "drop-off" are utilized, and "two-step dynamic electrochemical etching" is introduced to produce extremely sharp tips with controllable aspect ratio. Electronic cur...
متن کاملScanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
متن کاملSensing Performance Analysis on Quartz Tuning Fork-Probe at the High Order Vibration Mode for Multi-Frequency Scanning Probe Microscopy
Multi-frequency scanning near-field optical microscopy, based on a quartz tuning fork-probe (QTF-p) sensor using the first two orders of in-plane bending symmetrical vibration modes, has recently been developed. This method can simultaneously achieve positional feedback (based on the 1st in-plane mode called the low mode) and detect near-field optically induced forces (based on the 2nd in-plane...
متن کاملPiezoelectric Quartz Tuning Forks for Scanning Probe Microscopy
In this paper the application of piezoelectric quartz tuning forks in dynamic force microscopy is described. For the introduction we give a historical overview and a comparison with traditional cantilevers. In the second section the theories for tuning forks as oscillators for the dynamic force detection are introduced and in the third section the experimental implementation is described. This ...
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ژورنال
عنوان ژورنال: Journal of Vacuum Science & Technology B
سال: 2020
ISSN: 2166-2746,2166-2754
DOI: 10.1116/1.5132848